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SPIE Proceedings [SPIE 1985 Los Angeles Technical Symposium - Los Angeles (Monday 21 January 1985)] Spectroscopic Characterization Techniques for Semiconductor Technology II - <title>Faraday Rotation And Ellipticity In Silicon Mosfets: Properties Of Tne 2D Electron Gas</title>

SPIE Proceedings [SPIE 1985 Los Angeles Technical Symposium - Los Angeles (Monday 21 January 1985)] Spectroscopic Characterization Techniques for Semiconductor Technology II - Faraday Rotation And Ellipticity In Silicon Mosfets: Properties Of Tne 2D Electron Gas

Piller, Herbert; Pollak, Fred H.; Tsu, Raphael

作者Piller, Herbert; Pollak, Fred H.; Tsu, Raphael
卷第524卷
印刷ISSN0277-786X
文件大小456.22KB
发表时间1985
DOI10.1117/12.946325
页码101-105

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