[IEEE 1985 IEEE International Symposium on Electromagnetic Compatibility - Wakefield, Massachusetts (1985.8.20-1985.8.22)] 1985 IEEE International Symposium on Electromagnetic Compatibility - EM Susceptibility Studies and Measurements on Electro Explosive Devices

• 作者Deb, G K; Mukherjee, Manik
• 文件大小547.88KB
• 发表时间1985
• DOI10.1109/isemc.1985.7566998
• 页码1-8