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Attachment to spectrophotometers for measuring scattering patterns

Attachment to spectrophotometers for measuring scattering patterns

M. P. Esel'son; Yu. A. Sivyakov; A. Z. Krikun; R. Ya. Spivak

作者M. P. Esel'son; Yu. A. Sivyakov; A. Z. Krikun; R. Ya. Spivak
卷第43卷
期第2期
印刷ISSN0021-9037
电子ISSN1573-8647
文件大小125.00KB
发表时间1985-08
DOI10.1007/bf00660782
页码939-940

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