Reliability analysis for VLSI electronic systems
- 作者Christopher M. Snowden; Roger D. Pollard; Patrick D.T. O'Connor
- 卷第15卷
- 期第1期
- 印刷ISSN0143-8174
- 文件大小303.21KB
- 发表时间1986
- DOI10.1016/0143-8174(86)90052-1
- 页码21-28
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