Progress in semiconductor drift detectors
Pavel Rehak; Jack Walton; Emillo Gatti; Antonio Longoni; Marco Sanpietro; Josef Kemmer; Hans Dietl; Peter Holl; Robert Klanner; Gerhard Lutz; Andrew Wylie; Hubert Becker
- 作者Pavel Rehak; Jack Walton; Emillo Gatti; Antonio Longoni; Marco Sanpietro; Josef Kemmer; Hans Dietl; Peter Holl; Robert Klanner; Gerhard Lutz; Andrew Wylie; Hubert Becker
- 卷第248卷
- 印刷ISSN0168-9002
- 文件大小809.08KB
- 发表时间1986
- DOI10.1016/0168-9002(86)91021-1
- 页码367-378