Sterically hindered metal alkenyls. Part 1. Synthesis, reactions, and crystal and molecular structures of some palladium and platinum ?-alkenyls
- 期刊名称Journal of the Chemical Society, Dalton Transactions
- 作者Cardin, Christine J.; Cardin, David J.; Parge, Hans E.; Sullivan, Alice C.
- 期第11期
- 印刷ISSN0300-9246
- 电子ISSN1364-5447
- 文件大小812.03KB
- 发表时间1986
- DOI10.1039/dt9860002315
The Current State of Design History || The Current State of Design HistoryHazel Clark and David Brody · Journal of Design History · 2009
[ACS Symposium Series] Ionic Liquids: Current State and Future Directions Volume 1250 || Ionic Liquids: Current State and Future DirectionsShiflett, Mark B.; Scurto, Aaron M. · 2017
The Current State of Marxist State TheoryReview by: Fred Block · Contemporary Sociology · 1985
The Current State of the Chinese Communist Party in the Countryside || THE CURRENT STATE OF THE CHINESE COMMUNIST PARTY IN THE COUNTRYSIDEWibowo, Ignatius · 2000
Current State and Trends of Fault Current Limiting TechnologyShimizu, Hirotaka · IEEJ Transactions on Power and Energy · 2005
The current state of solid-state and molecular theoryJohn C. Slater · 1967
Decline or Impasse? The Current State of the Welfare StateMyles, John · Studies in Political Economy · 1988
State and Local Taxation: Review of Current State of ArtReview by: Orba F. Traylor · Public Administration Review · 1984
Graphene Frequency MultipliersHan Wang, ; Nezich, D.; Jing Kong, ; Palacios, T. · IEEE Electron Device Letters · 2009
Impact ionization in GaAs MESFETsHui, K.; Hu, C.; George, P.; Ko, P.K. · IEEE Electron Device Letters · 1990
Stability Analysis in CNTFETsHaji-Nasiri, Saeed; Moravvej-Farshi, Mohammad Kazem · IEEE Electron Device Letters · 2013
A Memristor Device ModelYakopcic, Chris; Taha, Tarek M.; Subramanyam, Guru; Pino, Robinson E.; Rogers, Stanley · IEEE Electron Device Letters · 2011
Junctionless Tunnel Field Effect TransistorGhosh, Bahniman; Akram, Mohammad Waseem · IEEE Electron Device Letters · 2013
Strained SOI FINFET SRAM DesignKerber, Pranita; Kanj, Rouwaida; Joshi, Rajiv V. · IEEE Electron Device Letters · 2013
Electromigration characteristics of copper interconnectsTao, J.; Cheung, N.W.; Hu, C. · IEEE Electron Device Letters · 1993
MOSFET drain breakdown voltageWu-Shiung Feng, ; Chan, T.Y.; Chenming Hu · IEEE Electron Device Letters · 1986