SPIE Proceedings [SPIE In Situ Industrial Applications of Optics - Brusssels, Belgium (Wednesday 25 June 1986)] In Situ Industrial Applications of Optics - Optical Diffraction Extensometers
Ebbeni, J; Sendrovicz, H; Ebbeni, Jean P. L.
- 作者Ebbeni, J; Sendrovicz, H; Ebbeni, Jean P. L.
- 卷第672卷
- 印刷ISSN0277-786X
- 文件大小158.02KB
- 发表时间1986
- DOI10.1117/12.939015
- 页码58-63