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SPIE Proceedings [SPIE In Situ Industrial Applications of Optics - Brusssels, Belgium (Wednesday 25 June 1986)] In Situ Industrial Applications of Optics - <title>Optical Diffraction Extensometers</title>

SPIE Proceedings [SPIE In Situ Industrial Applications of Optics - Brusssels, Belgium (Wednesday 25 June 1986)] In Situ Industrial Applications of Optics - Optical Diffraction Extensometers

Ebbeni, J; Sendrovicz, H; Ebbeni, Jean P. L.
  • 作者Ebbeni, J; Sendrovicz, H; Ebbeni, Jean P. L.
  • 卷第672卷
  • 印刷ISSN0277-786X
  • 文件大小158.02KB
  • 发表时间1986
  • DOI10.1117/12.939015
  • 页码58-63
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