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A characterization study of the native Oxide layer formed on chemically Etched InP (111)

A characterization study of the native Oxide layer formed on chemically Etched InP (111)

Gar B. Hoflund; Cheryl F. Corallo

作者Gar B. Hoflund; Cheryl F. Corallo
卷第9卷
期第5期
印刷ISSN0142-2421
电子ISSN1096-9918
文件大小509.14KB
发表时间1986
DOI10.1002/sia.740090509
页码319-323

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