SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Rays in Materials Analysis: Novel Applications and Recent Developments - Measurement of X-Ray Dielectric Constants With Coherent Transition Radiation
Moran, M. J.; Dahling, B. A.; Piestrup, M. A.; Berman, B. L.; Kephart, J. O.; Rusch, Thomas W.
- 作者Moran, M. J.; Dahling, B. A.; Piestrup, M. A.; Berman, B. L.; Kephart, J. O.; Rusch, Thomas W.
- 卷第690卷
- 印刷ISSN0277-786X
- 文件大小378.41KB
- 发表时间1986
- DOI10.1117/12.936611
- 页码146-152