Measuring Beam Leaded Diodes Nondestructively
- 作者White, J.F.; Parisi, S.J.
- 卷第35卷
- 期第12期
- 印刷ISSN0018-9480
- 电子ISSN1557-9670
- 文件大小759.95KB
- 发表时间1987
- DOI10.1109/tmtt.1987.1133868
- 页码1414-1418
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