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Study of defects in GaAs by differential thermal analysis

Study of defects in GaAs by differential thermal analysis

H. Lim; H. J. Von Bardeleben; J. C. Bourgoin

作者H. Lim; H. J. Von Bardeleben; J. C. Bourgoin
文件大小523.49KB
发表时间1987
DOI10.1063/1.339847

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