The effect of scan velocity on the measurement of semiconductor parameters by optical-beam excitation
Wilson, T.; Pester, P. D.
- 期刊名称Journal of Applied Physics
- 作者Wilson, T.; Pester, P. D.
- 卷第61卷
- 期第6期
- 印刷ISSN0021-8979
- 文件大小832.57KB
- 发表时间1987
- DOI10.1063/1.337941