SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices - Characterization By Electroreflectance Of Thin Films And Thin Film Interfaces In Layered Structures.
Niquet, G.; Dufour, J. P.; Chabrier, G.; Q' Jani, M.; Vernier, P.; Glembocki, Orest J.; Pollak, Fred H.; Song, Jin-Joo
- 作者Niquet, G.; Dufour, J. P.; Chabrier, G.; Q' Jani, M.; Vernier, P.; Glembocki, Orest J.; Pollak, Fred H.; Song, Jin-Joo
- 卷第794卷
- 印刷ISSN0277-786X
- 文件大小2706.54KB
- 发表时间1987
- DOI10.1117/12.940900
- 页码111-115