SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices - Nonlinear Transmission Of Semiconductor Thin Films
Van Stryland, E. W.; Miller, Steven A.; Wherrett, B. S.; Glembocki, Orest J.; Pollak, Fred H.; Song, Jin-Joo
- 作者Van Stryland, E. W.; Miller, Steven A.; Wherrett, B. S.; Glembocki, Orest J.; Pollak, Fred H.; Song, Jin-Joo
- 卷第794卷
- 印刷ISSN0277-786X
- 文件大小143.11KB
- 发表时间1987
- DOI10.1117/12.940923
- 页码262-265