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[IEEE 38th Electronics Components Conference 1988., Proceedings. - Los Angeles, CA, USA (9-11 May 1988)] 38th Electronics Components Conference 1988., Proceedings. - A limited study of the effects of contact normal force, contact geometry and wipe distance on contact resistance of gold-plated contacts

[IEEE 38th Electronics Components Conference 1988., Proceedings. - Los Angeles, CA, USA (9-11 May 1988)] 38th Electronics Components Conference 1988., Proceedings. - A limited study of the effects of contact normal force, contact geometry and wipe distance on contact resistance of gold-plated contacts

Brockman, I.H.; Sieber, C.S.; Mroczkowski, R.S.

作者Brockman, I.H.; Sieber, C.S.; Mroczkowski, R.S.
文件大小984.33KB
发表时间1988
DOI10.1109/ECC.1988.12594
页码198-207

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