Analysis of planar channeling effects on the threshold voltage uniformity of GaAs metal-semiconductor field-effect transistors using stereographic projection
Mikami, Hitoshi; Uchitomi, Naotaka; Toyoda, Nobuyuki
- 期刊名称Journal of Applied Physics
- 作者Mikami, Hitoshi; Uchitomi, Naotaka; Toyoda, Nobuyuki
- 卷第64卷
- 期第2期
- 印刷ISSN0021-8979
- 文件大小694.58KB
- 发表时间1988
- DOI10.1063/1.341950