[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Statistical modeling of silicon dioxide reliability
Lee, J.; Chen, I.-C.; Hu, C.
- 作者Lee, J.; Chen, I.-C.; Hu, C.
- 文件大小644.28KB
- 发表时间1988
- DOI10.1109/relphy.1988.23440
- 页码131-138