[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Statistics for electromigration testing
Schafft, H.; Lechner, J.A.; Sabi, B.; Mahaney, M.; Smith, R.C.
- 作者Schafft, H.; Lechner, J.A.; Sabi, B.; Mahaney, M.; Smith, R.C.
- 文件大小824.54KB
- 发表时间1988
- DOI10.1109/relphy.1988.23449
- 页码192-202