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[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Statistics for electromigration testing

[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Statistics for electromigration testing

Schafft, H.; Lechner, J.A.; Sabi, B.; Mahaney, M.; Smith, R.C.
  • 作者Schafft, H.; Lechner, J.A.; Sabi, B.; Mahaney, M.; Smith, R.C.
  • 文件大小824.54KB
  • 发表时间1988
  • DOI10.1109/relphy.1988.23449
  • 页码192-202
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