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[IEEE Comput. Soc. Press [1988 Proceedings] 9th International Conference on Pattern Recognition - Rome, Italy (14-17 Nov. 1988)] [1988 Proceedings] 9th International Conference on Pattern Recognition - Line drawing interpretation: bilateral symmetry

[IEEE Comput. Soc. Press [1988 Proceedings] 9th International Conference on Pattern Recognition - Rome, Italy (14-17 Nov. 1988)] [1988 Proceedings] 9th International Conference on Pattern Recognition - Line drawing interpretation: bilateral symmetry

Nalwa, V.S.
  • 作者Nalwa, V.S.
  • 文件大小433.93KB
  • 发表时间1988
  • DOI10.1109/icpr.1988.28437
  • 页码1049-1052
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