[IEEE 38th Electronics Components Conference 1988., Proceedings. - Los Angeles, CA, USA (9-11 May 1988)] 38th Electronics Components Conference 1988., Proceedings. - Interconnection reliability
- 作者Reagor, B.T.
- 文件大小360.11KB
- 发表时间1988
- DOI10.1109/ecc.1988.12592
- 页码188-191
Transitions electromagnetiques 6.92 MeV − 6.13 MeV et 7.12 MeV − 6.13 MeV dans 16OS. Gorodetzky; P. Mennrath; P. Chevallier; F. Scheibling; G. Sutter · 1962
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