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Electron microscope image contrast formed by electrons from elastic–inelastic and inelastic–elastic scattering processes

Electron microscope image contrast formed by electrons from elastic–inelastic and inelastic–elastic scattering processes

H. Hashimoto; A. Kumao
  • 作者H. Hashimoto; A. Kumao
  • 卷第107卷
  • 期第2期
  • 印刷ISSN1862-6319
  • 文件大小586.85KB
  • 发表时间1988
  • DOI10.1002/pssa.2211070215
  • 页码611-618
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