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Prediction of defect onset conditions in heat cycling based on a thermoelastic wafer model

Prediction of defect onset conditions in heat cycling based on a thermoelastic wafer model

Mokuya, K.; Matsuba, I.

作者Mokuya, K.; Matsuba, I.
卷第36卷
期第2期
印刷ISSN0018-9383
电子ISSN1557-9646
文件大小800.60KB
发表时间1989
DOI10.1109/16.19932
页码319-327

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