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X-ray photo-electron spectroscopy analysis of InP insulator-semiconductor structures prepared by anodic oxidation

X-ray photo-electron spectroscopy analysis of InP insulator-semiconductor structures prepared by anodic oxidation

H. Ishii; H. Hasegawa; A. Ishii; H. Ohno

作者H. Ishii; H. Hasegawa; A. Ishii; H. Ohno
印刷ISSN0169-4332
文件大小426.69KB
发表时间1989
DOI10.1016/0169-4332(89)90089-5
页码390-394

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