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Photoreflectance measurements of unintentional impurity concentrations in undoped GaAs

Photoreflectance measurements of unintentional impurity concentrations in undoped GaAs

M. Sydor; J. Angelo; W. Mitchel; T. W. Haas; M. Yen
  • 作者M. Sydor; J. Angelo; W. Mitchel; T. W. Haas; M. Yen
  • 文件大小741.82KB
  • 发表时间1989
  • DOI10.1063/1.343896
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