Photoemissive scanning microscopy of doped regions on semiconductor surfaces
- 期刊名称Applied Physics Letters
- 作者Quiniou, B.; Scarmozzino, R.; Wu, Z.; Osgood, R. M.
- 卷第55卷
- 期第5期
- 印刷ISSN0003-6951
- 文件大小543.98KB
- 发表时间1989
- DOI10.1063/1.101859
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