[ACM Press the second international conference - Tullahoma, Tennessee, United States (1989..-..)] Proceedings of the second international conference on Industrial and engineering applications of artificial intelligence and expert systems - IEA/AIE '89 - Knowledge based system to diagnose faults in discrete event systems
- 作者Sitaram, Muralidhar; Ernst, George; Marcuse, John
- 卷第1卷
- 文件大小396.44KB
- 发表时间1989
- DOI10.1145/66617.66639
- 页码171-177
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