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Silicon oxide epitaxial films investigated by neutron reflectivity

Silicon oxide epitaxial films investigated by neutron reflectivity

C. D. Ashworth; S. Messoloras; R. J. Stewart; J. G. Wilkes; I. S. Baldwin; J. Penfold
  • 作者C. D. Ashworth; S. Messoloras; R. J. Stewart; J. G. Wilkes; I. S. Baldwin; J. Penfold
  • 文件大小880.39KB
  • 发表时间1989
  • DOI10.1088/0022-3727/22/12/010
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