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SPIE Proceedings [SPIE 1988 Dearborn Symposium - Dearborn, MI (Monday 27 June 1988)] Optical Testing and Metrology II - <title>Talbot Bands : Determination Of Material Dispersion</title>

SPIE Proceedings [SPIE 1988 Dearborn Symposium - Dearborn, MI (Monday 27 June 1988)] Optical Testing and Metrology II - Talbot Bands : Determination Of Material Dispersion

Warenghem, M.; Grover, C. P.; Grover, Chander P.

作者Warenghem, M.; Grover, C. P.; Grover, Chander P.
卷第954卷
印刷ISSN0277-786X
文件大小453.03KB
发表时间1989
DOI10.1117/12.947578
页码95-100

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