The Impact of Clustered Defect Distributions in IC Fabrication
- 期刊名称Management Science
- 作者Albin, Susan L.; Friedman, David J.
- 卷第35卷
- 期第9期
- 印刷ISSN0025-1909
- 电子ISSN1526-5501
- 文件大小768.87KB
- 发表时间1989-09
- DOI10.1287/mnsc.35.9.1066
- 页码1066-1078
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