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[IEEE Micro Electro Mechanical Systems, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots. - Napa Valley, CA, USA (11-14 Feb. 1990)] IEEE Proceedings on Micro Electro Mechanical Systems, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots. - Spiral microstructures for the measurement of average strain gradients in thin films

[IEEE Micro Electro Mechanical Systems, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots. - Napa Valley, CA, USA (11-14 Feb. 1990)] IEEE Proceedings on Micro Electro Mechanical Systems, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots. - Spiral microstructures for the measurement of average strain gradients in thin films

Fan, L.-S.; Muller, R.S.; Yun, W.; Howe, R.T.; Huang, J.
  • 作者Fan, L.-S.; Muller, R.S.; Yun, W.; Howe, R.T.; Huang, J.
  • 文件大小358.60KB
  • 发表时间1990
  • DOI10.1109/MEMSYS.1990.110272
  • 页码177-181
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