[IEEE International Technical Digest on Electron Devices - San Francisco, CA, USA (9-12 Dec. 1990)] International Technical Digest on Electron Devices - The Emission Gated Device Experiment
Kodis, M.A.; Vanderplaats, N.R.; Zaidman, E.G.
- 作者Kodis, M.A.; Vanderplaats, N.R.; Zaidman, E.G.
- 文件大小279.12KB
- 发表时间1990
- DOI10.1109/iedm.1990.237019
- 页码893-896