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[IEEE International Technical Digest on Electron Devices - San Francisco, CA, USA (9-12 Dec. 1990)] International Technical Digest on Electron Devices - The Emission Gated Device Experiment

[IEEE International Technical Digest on Electron Devices - San Francisco, CA, USA (9-12 Dec. 1990)] International Technical Digest on Electron Devices - The Emission Gated Device Experiment

Kodis, M.A.; Vanderplaats, N.R.; Zaidman, E.G.
  • 作者Kodis, M.A.; Vanderplaats, N.R.; Zaidman, E.G.
  • 文件大小279.12KB
  • 发表时间1990
  • DOI10.1109/iedm.1990.237019
  • 页码893-896
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