[IEEE 40th Conference on Electronic Components and Technology - Las Vegas, NV, USA (20-23 May 1990)] 40th Conference Proceedings on Electronic Components and Technology - Automatic optical inspection (AOI)

• 作者Hecht, O.; Dishon, G.
• 文件大小309.50KB
• 发表时间1990
• DOI10.1109/ectc.1990.122259
• 页码659-661