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Interfacial lattice mismatch effects in III–V compoundsG.H. Olsen · 1975
4H-SiC visible blind UV avalanche photodiodeYan, F.; Luo, Y.; Zhao, J.H.; Olsen, G.H. · Electronics Letters · 1999
Large-area and visible response VPE InGaAs photodiodesWebb, P.P.; Olsen, G.H. · 1983
Virtual dissection of pig carcassesMartin Vester-Christensen; Søren G.H. Erbou; Mads F. Hansen; Eli V. Olsen; Lars B. Christensen; Marchen Hviid; Bjarne K. Ersbøll; Rasmus Larsen · 2009
Mannitol treatment in experimental haemophilus influenzae type b meningitisSyrogiannopoulos, G.A.; Olsen, K.D.; McCracken, G.H. · 1988
Demonstration of 4H-SiC Avalanche Photodiode Linear ArrayYan, Feng; Qin, C.; Zhao, Jian H.; Bush, M.; Olsen, G.H. · Materials Science Forum · 2002
Growth of copper-nickel alloy films suitable for use as substratesOlsen, G.H. · Journal of Applied Physics · 1972
Vapor growth of InGaAs and InP on (100), (110), (111), (311) and (511) InP substratesG.H. Olsen; T.J. Zamerowski; F.Z. Hawrylo · 1982
Graphene Frequency MultipliersHan Wang, ; Nezich, D.; Jing Kong, ; Palacios, T. · IEEE Electron Device Letters · 2009
Impact ionization in GaAs MESFETsHui, K.; Hu, C.; George, P.; Ko, P.K. · IEEE Electron Device Letters · 1990
Stability Analysis in CNTFETsHaji-Nasiri, Saeed; Moravvej-Farshi, Mohammad Kazem · IEEE Electron Device Letters · 2013
A Memristor Device ModelYakopcic, Chris; Taha, Tarek M.; Subramanyam, Guru; Pino, Robinson E.; Rogers, Stanley · IEEE Electron Device Letters · 2011
Junctionless Tunnel Field Effect TransistorGhosh, Bahniman; Akram, Mohammad Waseem · IEEE Electron Device Letters · 2013
Strained SOI FINFET SRAM DesignKerber, Pranita; Kanj, Rouwaida; Joshi, Rajiv V. · IEEE Electron Device Letters · 2013
Electromigration characteristics of copper interconnectsTao, J.; Cheung, N.W.; Hu, C. · IEEE Electron Device Letters · 1993
MOSFET drain breakdown voltageWu-Shiung Feng, ; Chan, T.Y.; Chenming Hu · IEEE Electron Device Letters · 1986