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[IEEE 32nd Midwest Symposium on Circuits and Systems - Champaign, IL, USA (14-16 Aug. 1989)] Proceedings of the 32nd Midwest Symposium on Circuits and Systems - Diagnosability and diagnosis of algorithm-based fault tolerant systems
Vinnakota, B.; Jha, N.K.
- 作者Vinnakota, B.; Jha, N.K.
- 文件大小591.41KB
- 发表时间1990
- DOI10.1109/mwscas.1989.101787
- 页码28-31
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