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[IEEE Comput. Soc. Press 10th International Conference on Pattern Recognition - Atlantic City, NJ, USA (16-21 June 1990)] [1990] Proceedings. 10th International Conference on Pattern Recognition - Measuring image structures using a multiscale orientation field

[IEEE Comput. Soc. Press 10th International Conference on Pattern Recognition - Atlantic City, NJ, USA (16-21 June 1990)] [1990] Proceedings. 10th International Conference on Pattern Recognition - Measuring image structures using a multiscale orientation field

Coggins, J.M.

作者Coggins, J.M.
文件大小248.02KB
发表时间1990
DOI10.1109/icpr.1990.118202
页码720-722

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