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SPIE Proceedings [SPIE The Hague '90, 12-16 April - The Hague, Netherlands (Thursday 1 March 1990)] Industrial Inspection II - <title>Neuronal networks for pattern recognition</title>

SPIE Proceedings [SPIE The Hague '90, 12-16 April - The Hague, Netherlands (Thursday 1 March 1990)] Industrial Inspection II - Neuronal networks for pattern recognition

Rueff, Manfred; Schmutz, Manfred; Braggins, Donald W.

作者Rueff, Manfred; Schmutz, Manfred; Braggins, Donald W.
卷第1265卷
印刷ISSN0277-786X
文件大小329.68KB
发表时间1990
DOI10.1117/12.20238
页码107-114

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