$SPIE Proceedings [SPIE Polarimetry '90, Huntsville, AL - Huntsville, AL (Monday 14 May 1990)] Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray - <title>Determination of the refractive-index tensor by bireflectance in biaxial crystals</title>$

SPIE Proceedings [SPIE Polarimetry '90, Huntsville, AL - Huntsville, AL (Monday 14 May 1990)] Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray - Determination of the refractive-index tensor by bireflectance in biaxial crystals

Lotem, Haim; Burshtein, Zeev; Chipman, Russell A.; Morris, John W.

作者Lotem, Haim; Burshtein, Zeev; Chipman, Russell A.; Morris, John W.
卷第1317卷
印刷ISSN0277-786X
文件大小212.38KB
发表时间1990
DOI10.1117/12.22082
页码191-194

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SPIE Proceedings [SPIE Polarimetry '90, Huntsville, AL - Huntsville, AL (Monday 14 May 1990)] Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray - Determination of the refractive-index tensor by bireflectance in biaxial crystals