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Quantitative XRF analysis of surface layers: Procedure for the determination of thickness and composition

Quantitative XRF analysis of surface layers: Procedure for the determination of thickness and composition

V. Rössiger; H.-J. Thomas
  • 作者V. Rössiger; H.-J. Thomas
  • 卷第19卷
  • 期第5期
  • 印刷ISSN0049-8246
  • 电子ISSN1097-4539
  • 文件大小591.69KB
  • 发表时间1990
  • DOI10.1002/xrs.1300190503
  • 页码211-217
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