SPIE Proceedings [SPIE 1989 Microelectronic Intergrated Processing Conferences - Santa Clara (Tuesday 10 October 1989)] Multichamber and In-Situ Processing of Electronic Materials - Effects Of HCl Gas And Hydrogen Mixture Etching On In Situ Cleaning Of GaAs Substrates In Molecular Beam Epitaxy
Saito, Junji; Kondo, Kazuo; Freund, Robert S.
- 作者Saito, Junji; Kondo, Kazuo; Freund, Robert S.
- 卷第1188卷
- 印刷ISSN0277-786X
- 文件大小7821.53KB
- 发表时间1990
- DOI10.1117/12.963945
- 页码115-124