Monte Carlo simulation and large deviations theory for uniformly recurrent Markov chains
Bucklew, James A; Ney, Peter; Sadowsky, John S.
- 期刊名称Journal of Applied Probability
- 作者Bucklew, James A; Ney, Peter; Sadowsky, John S.
- 卷第27卷
- 期第1期
- 印刷ISSN0021-9002
- 电子ISSN1475-6072
- 文件大小3549.26KB
- 发表时间1990-03
- DOI10.1017/s0021900200038419
- 页码44-59