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Monte Carlo simulation and large deviations theory for uniformly recurrent Markov chains

Monte Carlo simulation and large deviations theory for uniformly recurrent Markov chains

Bucklew, James A; Ney, Peter; Sadowsky, John S.
  • 期刊名称Journal of Applied Probability
  • 作者Bucklew, James A; Ney, Peter; Sadowsky, John S.
  • 卷第27卷
  • 期第1期
  • 印刷ISSN0021-9002
  • 电子ISSN1475-6072
  • 文件大小3549.26KB
  • 发表时间1990-03
  • DOI10.1017/s0021900200038419
  • 页码44-59
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