Measurement of electron mobility in liquid and gaseous Ar at low electric field strength and in the critical region
Lamp, P.; Eibl, R.; Buschhorn, G.
- 作者Lamp, P.; Eibl, R.; Buschhorn, G.
- 卷第26卷
- 期第4期
- 印刷ISSN0018-9367
- 文件大小306.12KB
- 发表时间1991
- DOI10.1109/14.83672
- 页码574-577