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Characterization of evaporated silicon films by inelastic electron tunneling spectroscopy

Characterization of evaporated silicon films by inelastic electron tunneling spectroscopy

Morihide Higo; Kouichi Nishino; Satsuo Kamata

作者Morihide Higo; Kouichi Nishino; Satsuo Kamata
卷第51卷
印刷ISSN0169-4332
文件大小827.24KB
发表时间1991
DOI10.1016/0169-4332(91)90062-o
页码61-69

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