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[IEEE 1991, International Test Conference - Nashville, TN (Oct. 26-30 1991)] 1991, Proceedings. International Test Conference - Fault Diagnosis using Functional Fault Models for VHDL descriptions

[IEEE 1991, International Test Conference - Nashville, TN (Oct. 26-30 1991)] 1991, Proceedings. International Test Conference - Fault Diagnosis using Functional Fault Models for VHDL descriptions

Pitchumani, V.; Mayor, P.; Radia, N.

作者Pitchumani, V.; Mayor, P.; Radia, N.
文件大小862.77KB
发表时间1991
DOI10.1109/test.1991.519525

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