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[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - Combining model development with characterization

[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - Combining model development with characterization

Scharfetter, D.; Duvall, S.

作者Scharfetter, D.; Duvall, S.
文件大小164.79KB
发表时间1991
DOI10.1109/iedm.1991.235260
页码976-977

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