Reorganizing circuits to aid testability
- 期刊名称IEEE Design & Test of Computers
- 作者Gupta, R.; Srinivasan, R.; Breuer, M.A.
- 卷第8卷
- 期第3期
- 印刷ISSN0740-7475
- 文件大小792.11KB
- 发表时间1991-09
- DOI10.1109/54.84244
- 页码49-57
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