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[IEEE 1991 International Conference on Circuits and Systems - Shenzhen, China (16-17 June 1991)] 1991 International Conference on Circuits and Systems - An effective algorithm for test application

[IEEE 1991 International Conference on Circuits and Systems - Shenzhen, China (16-17 June 1991)] 1991 International Conference on Circuits and Systems - An effective algorithm for test application

Zhou Zijian, ; Chen Junliang,

作者Zhou Zijian, ; Chen Junliang,
文件大小298.41KB
发表时间1991
DOI10.1109/ciccas.1991.184444
页码663-666

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