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The Laplacian of the charge density as a probe of reaction paths and reactivity: a comparison of SN2 reactions at carbon and silicon

The Laplacian of the charge density as a probe of reaction paths and reactivity: a comparison of SN2 reactions at carbon and silicon

Shi, Zheng; Boyd, Russell J.
  • 期刊名称The Journal of Physical Chemistry
  • 作者Shi, Zheng; Boyd, Russell J.
  • 卷第95卷
  • 期第12期
  • 印刷ISSN0022-3654
  • 电子ISSN1541-5740
  • 文件大小520.65KB
  • 发表时间1991-06
  • DOI10.1021/j100165a020
  • 页码4698-4701
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