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Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage.

Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage.

Barrio, L. C.; Suchyna, T.; Bargiello, T.; Xu, L. X.; Roginski, R. S.; Bennett, M. V.; Nicholson, B. J.
  • 期刊名称Proceedings of the National Academy of Sciences
  • 作者Barrio, L. C.; Suchyna, T.; Bargiello, T.; Xu, L. X.; Roginski, R. S.; Bennett, M. V.; Nicholson, B. J.
  • 卷第88卷
  • 期第19期
  • 印刷ISSN0027-8424
  • 电子ISSN1091-6490
  • 文件大小1435.82KB
  • 发表时间1991-10-01
  • DOI10.1073/pnas.88.19.8410
  • 页码8410-8414
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