Ability of reflection high energy electron diffraction (RHEED) to observe structural modifications in ion-implanted and annealed GaAs
- 作者M. Rossi; G. Vitali; D. Karpuzov; M. Kalitzova; H. Budinov
- 卷第26卷
- 期第12期
- 印刷ISSN0022-2461
- 电子ISSN1573-4803
- 文件大小1805.65KB
- 发表时间1991-06-15
- DOI10.1007/bf01124682
- 页码3337-3342