发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Identification of diluted small defect clusters in silicon by electron paramagnetic resonance

Identification of diluted small defect clusters in silicon by electron paramagnetic resonance

J. Kreissl; M. Hoehne; W. Gehlhoff

作者J. Kreissl; M. Hoehne; W. Gehlhoff
卷第20卷
期第1期
印刷ISSN0178-7683
电子ISSN1431-5866
文件大小278.35KB
发表时间1991
DOI10.1007/bf01544014
页码373-375

← 返回【学霸图书馆】主页